Focused Ion Beam: A Pioneering Tool in Nanotechnology and Materials Science by Emilie, Expert in Microscopy and Nanofabrication
Introduction:Focused Ion Beam (FIB) technology is an indispensable tool in nanotechnology, materials science, and semiconductor industries, offering unmatched precision in imaging, milling, deposition, and analysis at the micro and nano scale. FIB systems use a highly focused beam of ions, usually gallium, to manipulate surfaces with exceptional accuracy, making it a key instrument in tasks...
0 Comments 0 Shares 110 Views 0 Reviews
Sponsored